ASTM F1810-1997(2002) 择优统计硅片侵蚀或表面缺陷的标准试验方法

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【英文标准名称】:StandardTestMethodforCountingPreferentiallyEtchedorDecoratedSurfaceDefectsinSiliconWafers
【原文标准名称】:择优统计硅片侵蚀或表面缺陷的标准试验方法
【标准号】:ASTMF1810-1997(2002)
【标准状态】:作废
【国别】:
【发布日期】:1997
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.06
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:defectdensity;dislocation;grainboundary;microscopic;polycrystallineimperfection;preferentialetch;silicon;slip
【摘要】:ThisstandardwastransferredtoSEMI(www.semi.org)May20031.1Thistestmethoddescribesthetechniquetocountthedensityofsurfacedefectsinsiliconwafersbymicroscopicanalysis.Note18212;Practicaluseofadefectcountingmeth
【中国标准分类号】:H82
【国际标准分类号】:29_045
【页数】:4P.;A4
【正文语种】:


Product Code:SAE AS6086
Title:Validation Methods for AS5726 Micro Munition Interfaces
Issuing Committee:As-1b Aircraft Store Integration Committee
Scope: This document establishes techniques for validating that an Interface for Micro Munition (IMM) complies with the requirements delineated in AS5726. The purpose of this document is to provide methods for validating that a Micro Munition's electrical interface complies with the Micro Muntion interface requirements of AS5726. This document provides a modular, independent set of methods for each of the requirements in AS5726 that applies to Micro Munitions.
Rationale: This document establishes techniques for validating that an Interface for Micro Munition (IMM) complies with the requirements delineated in AS5726. The purpose of this document is to provide methods for validating that a Micro Munition's electrical interface complies with the Micro Muntion interface requirements of AS5726. This document provides a modular, independent set of methods for each of the requirements in AS5726 that applies to Micro Munitions.【英文标准名称】:Soundsystemequipment.Methodsforspecifyingandmeasuringthecharacteristicsofloudspeakers
【原文标准名称】:音响系统设备.第5部分:扬声器特性测量和编写详细说明的方法
【标准号】:BS6840Pt.5-1995
【标准状态】:作废
【国别】:英国
【发布日期】:1995-11-15
【实施或试行日期】:
【发布单位】:英国标准学会(BSI)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:作标记;作标记;声学试验;扬声器;音频系统;电子设备及元件;公式;声学测量;试验设备;性能试验;音频设备;声测量;电气试验;信号失真;声试验
【英文主题词】:
【摘要】:
【中国标准分类号】:M72
【国际标准分类号】:33_160_50
【页数】:48P;A4
【正文语种】:英语